Electron attenuation lengths in fullerene and fullerides

Journal of Electron Spectroscopy and Related Phenomena

Volumn 153, Issue 3, 2006, Pages 96-101

  Li, Hong Nian ^a   Wang, Xiao Xiong ^a   Ding, Wang Feng ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Attenuation length; C60; Fulleride; Inelastic mean free path; XPS

Indexed keywords

ATTENUATION LENGTH; FULLERIDE; INELASTIC MEAN FREE PATH; PHOTON ENERGY;

ALGORITHMS; ATTENUATION; ELECTRONS; PHOTOEMISSION; PHOTONS; X RAY PHOTOELECTRON SPECTROSCOPY;

FULLERENES;

EID: 33749637556     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2006.07.002     Document Type: Article

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