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Volumn 215, Issue 4, 2000, Pages 483-484

Crystal structure of 4,6-dinitroresorcinol, C6H4N2O6

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Indexed keywords


EID: 33749612889     PISSN: 14337266     EISSN: None     Source Type: Journal    
DOI: 10.1515/ncrs-2000-0412     Document Type: Article
Times cited : (10)

References (9)
  • 3
    • 0003519459 scopus 로고    scopus 로고
    • Organic Materials for Second-Order Non-Linear Optics
    • Editor D. Bethell
    • Wolff, J. J.; Wortmann, R.: Organic Materials for Second-Order Non-Linear Optics. In: Advances in Physical Organic Chemistry, Vol. 32, (Editor D. Bethell), p. 121-217, 1999.
    • (1999) Advances in Physical Organic Chemistry , vol.32 , pp. 121-217
    • Wolff, J.J.1    Wortmann, R.2
  • 5
    • 0000435520 scopus 로고
    • Intramolecular Hydrogen Bonding and Molecular Geometry of 4,6-Dinitroresorcinol from Gas-Phase Electron Diffraction
    • Borisenko, K.; Zauer, K.; Hargittai, I.: Intramolecular Hydrogen Bonding and Molecular Geometry of 4,6-Dinitroresorcinol from Gas-Phase Electron Diffraction. J. Phys. Chem. 99 (1995) 13808-13813.
    • (1995) J. Phys. Chem. , vol.99 , pp. 13808-13813
    • Borisenko, K.1    Zauer, K.2    Hargittai, I.3
  • 6
    • 0001117612 scopus 로고
    • A system of Fortran routines for calculating molecular structure parameters from the results of crystal structure analyses
    • Nardelli, M. A system of Fortran routines for calculating molecular structure parameters from the results of crystal structure analyses. J. Appl. Crystallogr. 28 (1995) 659.
    • (1995) J. Appl. Crystallogr. , vol.28 , pp. 659
    • Nardelli, M.1
  • 7
    • 84943920736 scopus 로고
    • Phase Annealing in SHELX-90: Direct Methods for Larger Structures
    • Sheldrick, G. M.: Phase Annealing in SHELX-90: Direct Methods for Larger Structures. Acta Crystallogr. A46 (1990) 467-473.
    • (1990) Acta Crystallogr. , vol.A46 , pp. 467-473
    • Sheldrick, G.M.1
  • 9
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M.: SHELXTL-Plus. Release 4.1 Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA 1991.
    • (1991) SHELXTL-plus. Release 4.1
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.