Defect control for low leakage current in K0.5Na 0.5NbO3 single crystals

Applied Physics Letters

Volumn 89, Issue 14, 2006, Pages

  Kizaki, Yoichi ^a   Noguchi, Yuji ^a,b   Miyayama, Masaru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT CONTROL; LEAD-FREE PIEZOELECTRIC DEVICES; LEAKAGE CURRENT DENSITY; OXIDATION CONDITIONS;

ANNEALING; CURRENT DENSITY; LEAKAGE CURRENTS; PARAMAGNETIC RESONANCE; PIEZOELECTRIC DEVICES; POTASSIUM ALLOYS; POTASSIUM COMPOUNDS; SUBSTITUTION REACTIONS;

SINGLE CRYSTALS;

EID: 33749583430     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2357859     Document Type: Article

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