Structural damage detection using the combination method of EMD and wavelet analysis

Mechanical Systems and Signal Processing

Volumn 21, Issue 1, 2007, Pages 298-306

  Li, Helong ^a   Deng, Xiaoyan ^b   Dai, Hongliang ^c  

^a SOUTH CHINA UNIVERSITY OF TECHNOLOGY   (China)

^b HUAZHONG AGRICULTURAL UNIVERSITY   (China)

^c GUANGDONG UNIVERSITY OF BUSINESS STUDIES   (China)

Author keywords

Damage detection; Empirical mode decomposition; Wavelet transform

Indexed keywords

DAMAGE DETECTION; EMPIRICAL MODE DECOMPOSITION(EMD); MONO-COMPONENT SIGNALS; WAVELET ANALYSIS;

DATA REDUCTION; FREQUENCY RESPONSE; SIGNAL PROCESSING; STRUCTURAL ANALYSIS; VIBRATIONS (MECHANICAL); WAVELET TRANSFORMS;

COMPUTATIONAL METHODS;

EID: 33749535038     PISSN: 08883270     EISSN: 10961216     Source Type: Journal    
DOI: 10.1016/j.ymssp.2006.05.001     Document Type: Article

References (5)

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5. Shyh-Jier Huang, and Chen-Wen Lu. Enhancement of digital equivalent voltage flicker measurement via continuous wavelet transform. IEEE Transactions on Power Delivery 19 2 (2004) 663-670