|
Volumn 3045, Issue , 2004, Pages 817-826
|
Resonant tunneling heterostructure devices - Dependencies on thickness and number of quantum wells
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CARRIER CONCENTRATION;
CURRENT VOLTAGE CHARACTERISTICS;
HETEROJUNCTIONS;
RESONANT TUNNELING;
COUPLED SYSTEMS;
DECOUPLING ALGORITHMS;
DOUBLE BARRIERS;
NUMERICAL RESULTS;
QUANTUM DRIFT-DIFFUSION MODELS;
QUANTUM WELL LAYERS;
RESONANT TUNNELING HETEROSTRUCTURE;
SPATIAL DEPENDENCIES;
SEMICONDUCTOR QUANTUM WELLS;
|
EID: 33749501247
PISSN: 03029743
EISSN: 16113349
Source Type: Book Series
DOI: 10.1007/978-3-540-24767-8_86 Document Type: Article |
Times cited : (7)
|
References (16)
|