Progress toward "optical beam induced noise" measurement set-up

AIP Conference Proceedings

Volumn 780, Issue , 2005, Pages 681-684

  Routoure, Jean Marc ^a   Méchin, Laurence ^a   Flament, Stéphane ^a  

^a UNIVERSITÉ DE CAEN   (France)

Author keywords

Defects; Noise; Optical beam induced

Indexed keywords

EID: 33749467410     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2036843     Document Type: Conference Paper

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