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Volumn 19, Issue 2-4, 1997, Pages 537-543

X-ray diffraction study on the correlation between ordered domains size and ordering degree in InGaP/GaAs alloy layers

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EID: 33749442011     PISSN: 03926737     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF03041014     Document Type: Article
Times cited : (3)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.