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Volumn 19, Issue 2-4, 1997, Pages 537-543
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X-ray diffraction study on the correlation between ordered domains size and ordering degree in InGaP/GaAs alloy layers
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33749442011
PISSN: 03926737
EISSN: None
Source Type: Journal
DOI: 10.1007/BF03041014 Document Type: Article |
Times cited : (3)
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References (9)
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