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Volumn 8, Issue 2, 2005, Pages

In-situ variable temperature powder X-ray diffraction and thermal analysis - Applications in the pharmaceutical industry

Author keywords

[No Author keywords available]

Indexed keywords

BENZYL THIOCYANATE; SODIUM CHLORIDE; SOLVENT;

EID: 33749404271     PISSN: 10998012     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (6)

References (7)
  • 2
    • 2442522517 scopus 로고    scopus 로고
    • Modern applications of powder X-ray diffraction in pharmaceutical sciences
    • K.D.M. Harris, "Modern Applications of Powder X-Ray Diffraction in Pharmaceutical Sciences", American Pharmaceutical Review, Vol. 7, Issue 2, 86-91, 2004.
    • (2004) American Pharmaceutical Review , vol.7 , Issue.2 , pp. 86-91
    • Harris, K.D.M.1
  • 3
    • 0242300742 scopus 로고    scopus 로고
    • Simulated PXRD patterns in studies of the phase composition and thermal behavior of bulk crystalline solids
    • S. Yin, R.P. Scaringe, J. DiMarco, M. Galella, and J.Z. Gougoutas, "Simulated PXRD Patterns in Studies of the Phase Composition and Thermal Behavior of Bulk Crystalline Solids", American Pharmaceutical Review, Vol. 6, Issue 2, 80-85, 2003.
    • (2003) American Pharmaceutical Review , vol.6 , Issue.2 , pp. 80-85
    • Yin, S.1    Scaringe, R.P.2    DiMarco, J.3    Galella, M.4    Gougoutas, J.Z.5
  • 4
    • 1542619806 scopus 로고    scopus 로고
    • Detection of polymorphism by powder X-ray diffraction: Interference by preferred orientation
    • M. Davidovich, J.Z. Gougoutas, R.P. Scaringe, I. Vitez, and S. Yin, "Detection of Polymorphism by Powder X-Ray Diffraction: Interference by Preferred Orientation", American Pharmaceutical Review, Vol. 7, Issue 1, 10-17, 2004.
    • (2004) American Pharmaceutical Review , vol.7 , Issue.1 , pp. 10-17
    • Davidovich, M.1    Gougoutas, J.Z.2    Scaringe, R.P.3    Vitez, I.4    Yin, S.5
  • 5
    • 84859676274 scopus 로고    scopus 로고
    • http://www.nist.gov
  • 7
    • 3743055007 scopus 로고
    • X-ray diffracometry at high temperatures
    • M. Ermrich, "X-Ray Diffracometry at High Temperatures", Materials Science Forum, Vol. 133-136, pp 267-270, 1993.
    • (1993) Materials Science Forum , vol.133-136 , pp. 267-270
    • Ermrich, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.