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Volumn 2006, Issue , 2006, Pages 28-

Integrated motion detection and tracking for visual surveillance

Author keywords

[No Author keywords available]

Indexed keywords

MOTION DETECTION; PARTICLE FILTER; VISUAL SURVEILLANCE SYSTEMS; VISUAL TRACKING;

EID: 33749379455     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICVS.2006.35     Document Type: Conference Paper
Times cited : (35)

References (21)
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  • 5
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    • Using adaptive tracking to classify and monitor activities in a site
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  • 8
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    • Moving target indication in LRAS3 sequences
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    • Q. Zheng and S. Der. Moving target indication in LRAS3 sequences, in 5th Annual Fedlab Symposium College Park MD, 2001
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  • 10
    • 0012713597 scopus 로고    scopus 로고
    • Fast connected-component labeling based on sequential local operations in the course of forward raster scan followed by backward raster scan
    • K. Suzuki, I. Horiba, and N. Sugie. Fast Connected-Component Labeling Based on Sequential Local Operations in the Course of Forward Raster Scan Followed by Backward Raster Scan, IEEE International Conference on Pattern Recognition (ICPR'00)- Volume 2, p. 24-34
    • IEEE International Conference on Pattern Recognition (ICPR'00) , vol.2 , pp. 24-34
    • Suzuki, K.1    Horiba, I.2    Sugie, N.3
  • 11
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    • A hierarchical model of dynamics for tracking people with a single video camera
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    • Karaulova, I.A.1    Hall, P.M.2    Marshall, A.D.3
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    • G. D. Hager, and P. N. Belhumeur. Efficient region tracking with parametric models of geometry and illumination, IEEE Trans. PAMI, vol. 20, pp. 1025-1039, Oct. 1998.
    • (1998) IEEE Trans. PAMI , vol.20 , pp. 1025-1039
    • Hager, G.D.1    Belhumeur, P.N.2
  • 14
    • 0025457309 scopus 로고
    • Recursive techniques for estimation of 3-d translation and rotation parameters from noisy image sequences
    • Apr.
    • T. J. Broida, S. Chandra, and R. Chellappa. Recursive techniques for estimation of 3-d translation and rotation parameters from noisy image sequences, IEEE Trans. Aerosp. Electron. Syst., vol. 26, pp. 639-656, Apr. 1990.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.