Novel method for unambiguous ion identification in mixed ion beams extracted from an electron beam ion trap

Review of Scientific Instruments

Volumn 77, Issue 9, 2006, Pages

  Meissl, W ^a   Simon, M C ^a   Crespo Lopez Urrutia J R ^b   Tawara, H ^b   Ullrich, J ^b   Winter, H P ^a   Aumayr, F ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON TRAPS; FLUXES; IONS;

ION IDENTIFICATION; ION TRAP; MASS TO CHARGE RATIO;

ION BEAMS;

EID: 33749370279     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2238856     Document Type: Article

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