Near-field microwave imaging utilizing tapered rectangular waveguides

IEEE Transactions on Instrumentation and Measurement

Volumn 55, Issue 5, 2006, Pages 1752-1756

  Qaddoumi, Nasser N ^a   Abou Khousa, Mohamed ^b   Saleh, Wael M ^a  

^a AMERICAN UNIVERSITY OF SHARJAH   (United Arab Emirates)

^b Architectural and Environmental Engineering   (United States)

Author keywords

Aperture area; Lateral resolution; Microwave nondestructive testing (NDT); Near field microwave imaging; Standard tapered waveguides

Indexed keywords

DATA ACQUISITION; DIELECTRIC WAVEGUIDES; MICROWAVE DEVICES; RECTANGULAR WAVEGUIDES; SENSITIVITY ANALYSIS;

APERTURE AREA; LATERAL RESOLUTION; MICROWAVE NONDESTRUCTIVE TESTING; NEAR-FIELD MICROWAVE-IMAGING;

IMAGING SYSTEMS;

EID: 33749369597     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2006.873818     Document Type: Article

References (9)

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