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Volumn 2006, Issue , 2006, Pages 349-354

Ultra-low energy computing with noise: Energy-performance-probability trade-offs

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY PERFORMANCE; NOISE SUSCEPTIBILITY; PROBABILISTIC CMOS (PCMOS) INVERTERS; PROBABILISTIC DEVICES;

EID: 33749361739     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISVLSI.2006.91     Document Type: Conference Paper
Times cited : (8)

References (23)
  • 1
    • 4444302686 scopus 로고    scopus 로고
    • Simultaneous optimization of supply and threshold voltages for low-power and high-performance circuits in the leakage dominant era
    • A. Basu, S. C. Lin, V. Wason, A. Mehrotra, and K. Banerjee. Simultaneous optimization of supply and threshold voltages for low-power and high-performance circuits in the leakage dominant era. In Proc. Design Automation Conf., pages 884-887, 2004.
    • (2004) Proc. Design Automation Conf. , pp. 884-887
    • Basu, A.1    Lin, S.C.2    Wason, V.3    Mehrotra, A.4    Banerjee, K.5
  • 2
    • 25144514874 scopus 로고    scopus 로고
    • Modeling and sizing for minimum energy operation in subthreshold circuits
    • B. H. Calhoun, A. Wang, and A. Chandrakasan. Modeling and sizing for minimum energy operation in subthreshold circuits. IEEE J. of Solid-State Circuits, 40:1778-1786, 2005.
    • (2005) IEEE J. of Solid-state Circuits , vol.40 , pp. 1778-1786
    • Calhoun, B.H.1    Wang, A.2    Chandrakasan, A.3
  • 3
    • 84949480508 scopus 로고    scopus 로고
    • Design sensitivities to variability: Extrapolations and assessments in nanometer VLSI
    • Y. Cao, P. Gupta, A. B. Kahng, D. Sylvester, and J. Yang. Design sensitivities to variability: Extrapolations and assessments in nanometer VLSI. In IEEE Intl. ASIC/SOC Conf., pages 411-415, 2002.
    • (2002) IEEE Intl. ASIC/SOC Conf. , pp. 411-415
    • Cao, Y.1    Gupta, P.2    Kahng, A.B.3    Sylvester, D.4    Yang, J.5
  • 6
    • 0030261554 scopus 로고    scopus 로고
    • An application-oriented error control scheme for high-speed networks
    • F. Gong and G. M. Parulkar. An application-oriented error control scheme for high-speed networks. IEEE/ACM Trans. Netw., 4(5):669-683, 1996.
    • (1996) IEEE/ACM Trans. Netw. , vol.4 , Issue.5 , pp. 669-683
    • Gong, F.1    Parulkar, G.M.2
  • 9
    • 0034245046 scopus 로고    scopus 로고
    • Toward achieving energy efficiency in presence of deep submicron noise
    • August
    • R. Hegde and N. R. Shanbhag. Toward achieving energy efficiency in presence of deep submicron noise. IEEE Trans. VLSI Syst., 8:379-391, August 2000.
    • (2000) IEEE Trans. VLSI Syst. , vol.8 , pp. 379-391
    • Hegde, R.1    Shanbhag, N.R.2
  • 10
    • 0037010916 scopus 로고    scopus 로고
    • End of Moore's law: Thermal (noise) death of integration in micro and nano electronics
    • December
    • L. B. Kish. End of Moore's law: thermal (noise) death of integration in micro and nano electronics. Physics Letters A, 305:144-149, December 2002.
    • (2002) Physics Letters A , vol.305 , pp. 144-149
    • Kish, L.B.1
  • 11
    • 84859288550 scopus 로고    scopus 로고
    • Characterizing the behaviour of a probabilistic CMOS switch through analytical models and its verification through simulations
    • P. Korkmaz, B. E. S. Akgul, and K. V. Palem. Characterizing the behaviour of a probabilistic CMOS switch through analytical models and its verification through simulations. Technical Report CREST-TR-05-08-01, Available at http://www.crest.gatech.edu/paiempbitscurrent/.
    • Technical Report , vol.CREST-TR-05-08-01
    • Korkmaz, P.1    Akgul, B.E.S.2    Palem, K.V.3
  • 12
    • 0029292398 scopus 로고
    • Low power microelectronics: Retrospect and prospect
    • April
    • J. D. Meindl. Low power microelectronics: retrospect and prospect. Proc: IEEE, 83:619-635, April 1995.
    • (1995) Proc: IEEE , vol.83 , pp. 619-635
    • Meindl, J.D.1
  • 14
    • 0042123349 scopus 로고    scopus 로고
    • Scaling limit of digital circuits due to thermal noise
    • May
    • K. Natori and N. Sano. Scaling limit of digital circuits due to thermal noise. J. of Applied Physics, 83:5019-5024, May 1998.
    • (1998) J. of Applied Physics , vol.83 , pp. 5019-5024
    • Natori, K.1    Sano, N.2
  • 16
    • 25844483771 scopus 로고    scopus 로고
    • Energy aware computing through probabilistic switching: A study of limits
    • September
    • K. V. Palem. Energy aware computing through probabilistic switching: A study of limits. IEEE Trans. Comput., pages 1123-1137, September 2005.
    • (2005) IEEE Trans. Comput. , pp. 1123-1137
    • Palem, K.V.1
  • 17
    • 33646864552 scopus 로고    scopus 로고
    • Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits
    • K. Roy, S. Mukhopadhyay, and H. Mahmoodi-Meimand. Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits. Proc. of the IEEE, 91:305-327, 2003.
    • (2003) Proc. of the IEEE , vol.91 , pp. 305-327
    • Roy, K.1    Mukhopadhyay, S.2    Mahmoodi-Meimand, H.3
  • 19
    • 0034246582 scopus 로고    scopus 로고
    • Increasing importance of electronic thermal noise in sub-0.1mm Si-MOSFETs
    • August
    • N. Sano. Increasing importance of electronic thermal noise in sub-0.1mm Si-MOSFETs. IEICE Trans. on Electronics, E83-C:1203-1211, August 2000.
    • (2000) IEICE Trans. on Electronics , vol.E83-C , pp. 1203-1211
    • Sano, N.1
  • 20
    • 0031619509 scopus 로고    scopus 로고
    • Design methodologies for noise in digital integrated circuits
    • June
    • K. L. Shepard, Design methodologies for noise in digital integrated circuits. In Proc. Design Automation Conf., pages 94-99, June 1998.
    • (1998) Proc. Design Automation Conf. , pp. 94-99
    • Shepard, K.L.1
  • 21
    • 0017547755 scopus 로고
    • Noise-induced error rate as a limiting factor for energy per operation in digital ICs
    • Oct.
    • K.-U. Stein. Noise-induced error rate as a limiting factor for energy per operation in digital ICs. IEEE J. Solid-State Circuits, 12:527-530, Oct. 1977.
    • (1977) IEEE J. Solid-state Circuits , vol.12 , pp. 527-530
    • Stein, K.-U.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.