Non-destructive micro-X-ray diffraction analysis of painted artefacts: Determination of detection limits for the chromium oxide-zinc oxide matrix

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 251, Issue 2, 2006, Pages 489-495

  Nel, P ^a   Lau, D ^a   Hay, D ^a   Wright, N ^a  

^a CSIRO   (Australia)

Author keywords

Crystalline and amorphous phases; Detection limits of chromium oxide zinc oxide mixtures; In situ micro XRD; Non destructive analysis

Indexed keywords

ABSORPTION; CHROMIUM COMPOUNDS; CONCENTRATION (PROCESS); MIXTURES; NONDESTRUCTIVE EXAMINATION; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS PHASES; CRYSTALLINE PHASES; PIGMENT FILMS;

CRYSTALLINE MATERIALS;

EID: 33749354573     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.07.003     Document Type: Article

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