Characterizing the system performance of FIFI LS: The field-imaging far-infrared line spectrometer for SOFIA

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6269 I, Issue , 2006, Pages

  Raab, W ^a   Poglitsch, A ^a   Klein, R ^b   Hoenle, R ^a   Schweizer, M ^a   Viehhauser, W ^a   Geis, N ^a   Genzel, R ^a   Looney, L W ^c   Hamidouche, M ^c   Henning, T ^d   Haller, E E ^b  

^a MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^d MAX PLANCK INSTITUT FÜR ASTRONOMIE   (Germany)

Author keywords

Far Infrared; FIFI; FIFI LS; Integral Field Imaging; SOFIA; Spectrometer

Indexed keywords

AIRBORNE TELESCOPES; DIFFRACTION GRATINGS; IMAGE ANALYSIS; IMAGING SYSTEMS; REFLECTION; SENSITIVITY ANALYSIS;

FAR-INFRARED; FIFI LS; INTEGRAL FIELD IMAGING; SOFIA;

INFRARED SPECTROMETERS;

EID: 33749352276     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.671483     Document Type: Conference Paper

References (12)

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