The LSST sensor technologies studies

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6276, Issue , 2006, Pages

  Geary, J ^a   Figer, D ^b   Gilmore, D K ^c   O'Connor, P ^d   Oliver, J ^e   Radeka, V ^d   Stubbs, C ^f   Takas, P ^d   Tyson, J A ^g  

^a HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

^b STScI   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

^e HARVARD UNIVERSITY   (United States)

^f HARVARD UNIVERSITY   (United States)

^g UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

CCD; CMOS; Imager; LSST; Sensor

Indexed keywords

FOCAL PLANES; LSST; PROTOTYPE PRODUCTIONS;

FOCUSING; INFRARED SPECTROSCOPY; PROJECT MANAGEMENT; RISK MANAGEMENT; SPACE RESEARCH;

OPTICAL SENSORS;

EID: 33749349637     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.673291     Document Type: Conference Paper

References (1)

1. P. O'Connor et al., "Study of silicon thickness optimization for LSST", Proc. SPIE 6276 (in press), 2006.