Limitations in the use of R.M.S. value in power quality analysis

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2006, Pages 2261-2264

  Barros, J ^a   Perez E ^a  

^a UNIVERSITY OF CANTABRIA   (Spain)

Author keywords

Power quality; Root mean square; Voltage dips

Indexed keywords

ELECTRIC POTENTIAL; ERROR ANALYSIS; STANDARDS;

DETECTION PROPERTIES; ROOT MEAN SQUARE; ROOT MEAN SQUARE (RMS) VALUE; VOLTAGE DIPS;

POWER QUALITY;

EID: 33749342364     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2006.235047     Document Type: Conference Paper

References (6)

1. th IEEE International Conference on Harmonics and Quality of Power 2000, Orlando, Florida. USA, Oct. 14, 2000, Vol. 3, pp. 790-795.
2. E. Styvaktakis. M.H.J. Bollen. I.Y.H. Gu, "Automatic Classification of Power System Events using rms Voltage Measurements," IEEE Power Engineering Society Summer Meeting 2002, Chicago, USA, Vol. 2, pp. 824-829.
3. M. Albu, G.T. Heydt, "On the Use of rms Values in Power Quality Assessment," IEEE Transactions on Power Delivery, Vol. 18, No. 4, October 2003, pp. 1586-1587.
4. International Electrotechnical Commission, 2003, "IEC 610004-30. Part 4: Testing and measurement techniques. Section 30: Power quality measurement methods".
5. IEEE Recommended Practice for Monitoring Electric Power Quality, IEEE Std 1159-1995, IEEE New York, USA, 1995.
6. ITI (CBEMA) Curve Application Note (available at http://www.itic.org/ techninal/iticurv.pdf)