Regulatory aspects of X-ray powder diffraction, part 1

American Pharmaceutical Review

Volumn 8, Issue 3, 2005, Pages 55-59

  Byrn, Stephen R ^a   Bates, Simon ^a   Ivanisevic, Igor ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; CONFORMATION; CRYSTALLIZATION; FOURIER TRANSFORMATION; GEOMETRY; INSTRUMENTATION; REVIEW; SOLID STATE; X RAY POWDER DIFFRACTION;

EID: 33749331962     PISSN: 10998012     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (8)

1. Wunderlich B. Thermochimica Acta 340-341 (1999) 37-52.
2. Cowley J.M. Diffraction Physics: North Holland; Elsevier Science Publishers B.V. 1981.
3. CSD Cambridge Structural Database, Cambridge Crystallographic Data Center, (2004).
4. Cernik, R.J., A.K. Cheetham, C.K. Prout, D.J. Watkin, A.P. Wilkinson, and B.T.M. Willis (1991) J. Appl. Crystallogr. 24 222-224.
5. Fagan, Paul G., Robert B. Hammond, Kevin J. Roberts, Robert Docherty, Alan P. Chorlton, William Jones, and Graham D. Potts (1995) Chem. Mater. 7 2322-2326.
6. A.R. Sheth, S. Bates, F.X. Muller, and D.J.W. Grant Crystal Growth & Design (2004) in press.
7. Proffen T., Billinge S.J.L., Egami T., Louca D. Z. Kristallogr., (2003). 218, 132-143.
8. Peterson P.F., Bosin E.S., Proffern T., Billinge S.J.L. J. Appl. Cryst (2003), 36, 53-64.