Dynamic variation in the lattice parameter of a crystal under ultrasonic treatment in X-ray diffraction experiments

Crystallography Reports

Volumn 51, Issue 5, 2006, Pages 729-733

  Blagov, A E ^a   Kovalchuk, M V ^a,b   Kohn, V G ^b   Pisarevsky, Yu V ^a  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^b KURCHATOV INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; LATTICE CONSTANTS; SILICON; STRAIN MEASUREMENT; STROBOSCOPES; X RAY DIFFRACTION ANALYSIS;

DYNAMIC VARIATION; STRAIN WAVES; TIME INTEGRATED MODE; ULTRASONIC TREATMENT;

SINGLE CRYSTALS;

EID: 33749325451     PISSN: 10637745     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063774506050026     Document Type: Article

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