Leakage current measurements on pixelated CdZnTe detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 567, Issue 1 SPEC. ISS., 2006, Pages 145-149

  Dirks, B P F ^a,b   Blondel, C ^a   Daly, F ^a   Gevin, O ^a   Limousin, O ^a   Lugiez, F ^a  

^a CEA SACLAY   (France)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Activation energy; CdTe CdZnTe; Leakage current; Pixels; X ray detection

Indexed keywords

ACTIVATION ENERGY; CAMERAS; INTERMETALLICS; LEAKAGE CURRENTS; LIGHT POLARIZATION; MEASUREMENT THEORY; RESEARCH AND DEVELOPMENT MANAGEMENT; X RAY ANALYSIS;

CDTE/CDZNTE; DEFECT DENSITY DIAGNOSTICS; PIXELS; X-RAY DETECTION;

DETECTORS;

EID: 33749318456     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.05.077     Document Type: Article

References (3)

1. Ferrando P. Proc. SPIE 5168 (2004)
2. Limousin O., et al. IEEE Trans. Nucl. Sci. NS-52 5 (2005)
3. Gevin O., et al. Proc. IEEE Puerto Rico (2005)