Structural, microstructural and dielectric studies of tin-doped barium niobate perovskite

Journal of Materials Science: Materials in Electronics

Volumn 17, Issue 11, 2006, Pages 963-970

  Chitgopikar, Girija ^a,b   Chickpatil, Mallikarjun ^a,c   Raibagkar, Ravindra L ^a  

^a GULBARGA UNIVERSITY   (India)

^b Department of Physics   (India)

^c Department of Electronics   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DIELECTRIC PROPERTIES; GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY; TIN COMPOUNDS;

DIELECTRIC MEASUREMENT; TIN-DOPED BARIUM NIOBATE PEROVSKITE; X-RAY DENSITY;

PEROVSKITE;

EID: 33749259559     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-006-0035-y     Document Type: Article

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