Influence of monitor passband width to layer thickness determination during depositing a DWDM filter

Optics InfoBase Conference Papers

Volumn , Issue , 2004, Pages

  Kuo, Chien Cheng ^a   Chen, Sheng Hui ^a   Lee, Cheng Chung ^a   Lu, Douglas ^b   Wei, Ching Yi ^b  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^b Glac Biotech Co   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS;

DWDM FILTERS; LAYER THICKNESS; PASSBAND WIDTH; QUARTZ MONITOR; THICKNESS DETERMINATION;

DENSE WAVELENGTH DIVISION MULTIPLEXING;

EID: 33749236233     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. H. A. Macleod, "Tutorial on the design of telecommunication filters", OSA, Optical Interference Coatings Conference, July 15-20, P.WC1, Banff, Alberta, Canada, (2001).
2. rdEd., Chap.12, (2002).
3. R. R. Willey, "Achieving narrow bandpass filters which meet the requirements for DWDM", Thin Solid Films, 398-399, 1-9, (2001).
4. P. Bousquet, A. Fornier, R. Kowalczak, E. Pelletier and P. Roche, "Optical filters: monitoring process allowing the auto-correction of thickness errors" Thin Solid Films, 13, 285-290, (1972).