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Volumn 6268 II, Issue , 2006, Pages
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High precision calibration of interferometric data through the removal of fixed-pattern residuals
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NVI Inc
(United States)
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Author keywords
Calibration; Interferometric data
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Indexed keywords
CALIBRATION;
INTERFEROMETRY;
OPTICAL SYSTEMS;
INTERFEROMETRIC DATA;
NAVY PROTOTYPE OPTICAL INTERFEROMETER;
DATA REDUCTION;
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EID: 33749236111
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.672043 Document Type: Conference Paper |
Times cited : (4)
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References (4)
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