Investigating activated sludge flocs using microanalytical techniques: Demonstration of environmental scanning electron microscopy and time-of-flight secondary ion mass spectrometry for wastewater applications

Water Environment Research

Volumn 78, Issue 4, 2006, Pages 381-391

  Holbrook, R David ^a,c   Wagner, Matthew S ^a,b   Mahoney, Christine M ^a   Wight, Scott A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b PROCTER AND GAMBLE COMPANY   (United States)

^c Mail Stop 8371 ^*  (United States)

Author keywords

Activated sludge; Characterization; Environmental scanning electron microscopy; Imaging; Microanalysis; Principal component analysis; Time of flight secondary ion mass spectrometry

Indexed keywords

ACTIVATED SLUDGE PROCESS; IMAGING TECHNIQUES; MICROANALYSIS; POLYSACCHARIDES; PRINCIPAL COMPONENT ANALYSIS; PROTEINS;

ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY; MIXED LIQUOR SUSPENDED SOLID (MLSS); TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY;

WASTEWATER TREATMENT;

ALUMINUM; IRON; ORGANIC COMPOUND; POLYSACCHARIDE; PROTEIN;

ACTIVATED SLUDGE PROCESS; IMAGING TECHNIQUES; MICROANALYSIS; POLYSACCHARIDES; PRINCIPAL COMPONENT ANALYSIS; PROTEINS; WASTEWATER TREATMENT;

ACTIVATED SLUDGE; ALUMINUM; ANALYTICAL METHOD; IRON; MASS SPECTROMETRY; POLYSACCHARIDE; PROTEIN; SCANNING ELECTRON MICROSCOPY; X-RAY SPECTROSCOPY;

ACTIVATED SLUDGE; AQUEOUS SOLUTION; ARTICLE; EFFLUENT; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY; PARTICULATE MATTER; PRINCIPAL COMPONENT ANALYSIS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TIME OF FLIGHT MASS SPECTROMETRY; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; WASTE WATER MANAGEMENT; BIOREACTOR; DIAGNOSTIC IMAGING; FLOCCULATION; MASS SPECTROMETRY; METHODOLOGY; SEWAGE; SPECTROMETRY; WATER MANAGEMENT; WATER POLLUTANT;

BIOREACTORS; DIAGNOSTIC IMAGING; FLOCCULATION; MICROSCOPY, ELECTRON, SCANNING; SEWAGE; SPECTROMETRY, MASS, SECONDARY ION; SPECTROMETRY, X-RAY EMISSION; WASTE DISPOSAL, FLUID; WATER POLLUTANTS; WATER PURIFICATION;

EID: 33749182830     PISSN: 10614303     EISSN: None     Source Type: Journal    
DOI: 10.2175/106143005X90092     Document Type: Article

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