An on-chip jitter measurement circuit with sub-picosecond resolution

Proceedings of ESSCIRC 2005: 31st European Solid-State Circuits Conference

Volumn , Issue , 2005, Pages 157-160

  Jenkins, Keith A ^a   Jose, Anup P ^b   Heidel, David F ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b Columbia University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OFF-CHIP MEASUREMENTS; ON-CHIP MEASUREMENT; RESOLUTION MEASUREMENTS; SUB-PICOSECOND RESOLUTIONS;

CATHODE RAY OSCILLOSCOPES; CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUITS; TIMING JITTER;

MICROPROCESSOR CHIPS;

EID: 33749182792     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSCIR.2005.1541583     Document Type: Conference Paper

References (5)

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3. Frisch, A. M. and Rinderkneckt, T. H., US Patent No. 6295315.
4. Ishida, M., et al, Digest of ISSCC 2005, p. 512-514 (2005).
5. Montanaro, J., et al, IEEE Journal of Solid-State Circuits 31, pp. 1703-1714 (1996).