Surface-acoustic-wave single-electron interferometry

Physical Review B - Condensed Matter and Materials Physics

Volumn 72, Issue 8, 2005, Pages

  Rodriquez, Roberta ^a,b   Oi, Daniel K L ^a   Kataoka, Masaya ^b   Barnes, Crispin H W ^b   Ohshima, Toshio ^a,c   Ekert, Artur K ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c Fujitsu Laboratories of Europe Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33749159459     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.085329     Document Type: Article

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