Atomic-dimensional film of TiO2-x and its quantum size effect UV-VIS, XPS, SEM and TEM study

Journal of the Chemical Society - Faraday Transactions

Volumn 93, Issue 23, 1997, Pages 4187-4195

  Xu, Wei Xing ^a   Zhu, Shu ^b   Zhou, Jin ^a   Fu, Xian Cai ^a   Zhao, Xiao Ning ^a  

^a NANJING UNIVERSITY   (China)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33749090949     PISSN: 09565000     EISSN: None     Source Type: Journal    
DOI: 10.1039/a703705h     Document Type: Article

References (31)

1. L. Kavan, T. Stoto, M. Graetzel, D. Fitzmaurice and V. Shklover, J. Phys. Chem., 1993, 97, 9493.
2. C. Kormann, D. W. Bahnemann and M. R. Hoffmann, J. Phys. Chem., 1988, 92, 5196.
3. K. Jurek, M. Guglielmi, G. Kuncova, O. Renner, F. Lukes, M. Navratil, E. Krousky, V. Vorlicek and K. Kokesova, J. Mater. Sci., 1992, 27, 2549.
4. C. J. Sandroff, D. M. Hwang and W. M. Chung, Phys. Rev. B, 1986, 33, 5953.
5. C. J. Sandroff, S. P. Kelty and D. M. Hwang, J. Chem. Phys., 1986, 85, 5337.
6. G. Lassaletta, A. Fernandez, J. P. Espinos and A. R. Gonzalez-Elipe, J. Phys. Chem., 1995, 99, 1484.
7. E. S. Smotkin, Ch. Lee, A. J. Bard, A. Sampion, M. A. Fox, T. F. Maloouk, S. E. Webber and J. M. White, Chem. Phys. Lett., 1988, 152, 265.
8. M. Anpo, T. S. Shima, S. Kodama and Y. Kubokawa, J. Phys. Chem., 1987, 91, 4305.
9. J. C. Bailar, Jr., H. J. Emeleus, Sir R. Nyholm and A. F. Trotman-Dickenson, Comprehensive Inorganic Chemistry, Pergamon Press, Oxford, 1973, vol. 3, p. 376.
10. J. A. Pople, Gaussian, Inc., Pittsburgh, PA.
11. W. Stevens, H. Basch and M. Krauss, J. Chem. Phys., 1984, 81, 6026.
12. P. J. Hay and W. R. Wadt, J. Chem. Phys., 1985, 82, 270.
13. W. R. Wadt and P. J. Hay, J. Chem. Phys., 1985, 82, 284.
14. P. J. Hay and W. R. Wadt, J. Chem. Phys., 1985, 82, 299.
15. L. Kavan, B. O'Regan, A. Kay and M. Graetzel, J. Electroanal. Chem., 1993, 346, 291.
16. H. R. Gerd, Ph.D. Thesis, Montana State University, Bozeman, Montana, 1985.
17. M. Anpo, N. Aikawa, Y. Kubokawa, M. Che, C. Louis and E. Giamello, J. Phys. Chem., 1985, 89, 5017.
18. M. Anpo, H. Nakaya, S. Kodama, Y. Kubokawa, K. Domen and T. Onishi, J. Phys. Chem., 1986, 90, 1633.
19. M. Anpo, T. Kawamura, S. Kodama, K. Maruye and T. Onishi, J. Phys. Chem., 1988, 92, 438.
20. M. F. Best and R. A. Condrate, J. Mater. Sci. Lett., 1985, 4, 994
21. A. H. Goff, Thin Solid Films, 1986, 142, 193.
22. J. Mugnier, B. Varrel, M. Bahtat, C. Bovier and J. Serughetti, J. Mater. Sci. Lett., 1992, 11, 875
23. I. Moriguchi, H. Maeda, Y. Teraoka and S. Kagawa, J. Am. Chem. Soc., 1995, 117, 1139
24. C. Kormann, D. W. Bahnemann and M. R. Hoffmann, J. Phys. Chem., 1988, 92, 5196
25. M. Anpo, T. Shima, S. Kodama and Y. Kubokawa, J. Phys. Chem., 1987, 91, 4305.
26. M. Tsukada, C. Satoko and H. Adachi, J. Phys. Soc. Jpn., 1979, 47, 1610.
27. W. X. Xu, K. D. Schierbaum and W. Goepel, J. Solid State Chem., 1995, 119, 237.
28. K. D. Schierbaum and W. X. Xu, Int. J. Quantum. Chem., 1996, 57, 1121.
29. G. V. Samsonov, The Oxide Handbook, translated from Russian by R. K. Johnston, IFI/Plenum Data Company, New York, 1982.
30. A. Fernandez, A. Caballero and A. R. Gonzalez-Elipe, Surf. Interface Anal., 1992, 18, 392.
31. D. Briggs, Handbook of X-ray and Ultraviolet Photoelectron Spectroscopy, Heyden & Son Ltd, 1977.