Faceting and commensurability in crystal structures of colloidal thin films

Physical Review Letters

Volumn 97, Issue 2, 2006, Pages

  Ramiro Manzano, F ^a   Meseguer, F ^a   Bonet, E ^a   Rodriguez, I ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; MONOLAYERS; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; THIN FILMS;

CRYSTALLOGRAPHIC FACETING; FACET ORIENTATION; HIGH SYMMETRY LAYERING; MICROCRYSTALLITES;

HIGH ENERGY PHYSICS;

NANOMATERIAL;

ARTICLE; CHEMISTRY; COLLOID; CRYSTALLIZATION; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY; ULTRASTRUCTURE; X RAY DIFFRACTION;

COLLOIDS; CRYSTALLIZATION; MICROSCOPY, ELECTRON, SCANNING; NANOSTRUCTURES; PARTICLE SIZE; X-RAY DIFFRACTION;

EID: 33749078139     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.97.028304     Document Type: Article

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