Large area terahertz imaging and non-destructive evaluation applications

Insight: Non-Destructive Testing and Condition Monitoring

Volumn 48, Issue 9, 2006, Pages 537-539

  Zimdars, David ^a   White, Jeffrey S ^a   Stuk, G ^a   Chernovsky, A ^a   Fichter, G ^a   Williamson, S ^a  

^a Picometrix Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSPACE APPLICATIONS; INSPECTION; NONDESTRUCTIVE EXAMINATION; REFLECTION; SPACE SHUTTLES;

FOAM INSULATION (SOFI); TERAHERTZ (THZ) IMAGING;

IMAGING SYSTEMS;

EID: 33749072038     PISSN: 13542575     EISSN: None     Source Type: Journal    
DOI: 10.1784/insi.2006.48.9.537     Document Type: Article

References (5)

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2. D Zimdars, 'Fibre-pigtailed terahertz time domain spectroscopy instrumentation for package inspection and security imaging', Proceedings of SPIE, Terahertz Military and Security Applications, J Hwu and D L Woolard, Eds, Orlando, Fla, 5070, p 108, 2003.
3. M C Kemp, P F Taday, B E Cole, J A Cluff, A J Fitzgerald and W R Tribe, 'Security applications of terahertz technology', Proceedings of SPIE, Terahertz Military and Security Applications, J Hwu and D L Woolard, Eds, Orlando, Fla, 5070, p 44, 2003.
4. D M Mittleman, M Gupta, R Neelamani, R G Baraniuk, J V Rudd and M Koch, 'Recent advances in terahertz imaging', Appl Phys B, 68, p 1085, 1999.
5. D M Mittleman, R H Jacobsen and M C Nuss, 'T-ray imaging', IEEE J Quantum Electron, 20, p 679, 1996.