An adaptive singular value decomposition (SVD) algorithm for analysis of wavelength modulation spectra

Applied Physics B: Lasers and Optics

Volumn 85, Issue 2-3, 2006, Pages 461-466

  Bomse, D S ^a   Kane, D J ^a  

^a SOUTHWEST SCIENCES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACETYLENE; ALGORITHMS; OPTICAL FILTERS; OPTICAL PROPERTIES; PRINCIPAL COMPONENT ANALYSIS; THERMAL NOISE;

FRINGE SPACINGS; OPTICAL INTERFERENCE FRINGES; SINGULAR VALUE DECOMPOSITION (SVD) ALGORITHM; TELECOMMUNICATIONS LASERS;

SEMICONDUCTOR LASERS;

EID: 33749039194     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-006-2316-9     Document Type: Article

References (22)

1. J.A. Silver, Appl. Opt. 31, 707 (1992)
2. J.A. Silver, A.C. Stanton, Appl. Opt. 27, 1914 (1988)
3. C.R. Webster, J. Opt. Soc. Am. B 2, 1464 (1985)
4. D.T. Cassidy, J. Reid, Appl. Phys. B 29, 279 (1982)
5. P.W. Werle, P. Mazzinghi, F. D'Amato, M. De Rosa, K. Maurer, F. Slemr, Spectrochim. Acta A 60, 1685 (2004)
6. D.C. Hovde, J.T. Hodges, G.E. Scace, J.A. Silver, Appl. Opt. 40, 829 (2001)
7. D.P. Leleux, R. Claps, W. Chen, F.K. Tittel, T.L. Harman, Appl. Phys B 74, 85 (2002)
8. J.A. Silver, W.R. Wood, Proc. SPIE 4817, 82 (2002)
9. W.H. Press, B.P. Flannery, S.A. Teukolsky, W.T. Vetterling, Numerical Recipes: The Art of Scientific Computing (Cambridge University Press, Cambridge, New York, 1986), Chapts. 2.9 and 14.3
10. D.S. Bomse, A.C. Stanton, J.A. Silver, Appl. Opt. 31, 718 (1982)
11. D.B. Oh, M.E. Paige, D.S. Bomse, Appl. Opt. 37, 2499 (1998)
12. J. Reid, D. Labrie, Appl. Phys. B 26, 203 (1981)
13. T. Fernholz, H. Teichert, V. Ebert, Appl. Phys B 75, 229 (2002)
14. D.C. Hovde, Filtering to Measure Gas Concentrations from Spectral Features, US Patent 6,615,142; issued Sep. 2, 2003. The full patent is available in PDF format free of charge at Southwest Sciences' web site: http://www.swsciences.com/technology/patents.html
15. M.E. Wall, A. Rechtsteiner, L.M. Rocha, Singular Value Decomposition and Principal Component Analysis: In: A Practical Approach to Microarray Data Analysis, ed. by D.P. Berrar, W. Dubitzky, M. Granzow (Kluwer, Norwell, MA, 2003)
16. M.A. Sharaf, D.L. Illman, B.R. Kowalski, Chemometrics (Wiley-Interscience, New York, 1986), Chapts. 5 and 6
17. A. Hayden, E. Niple, B. Boyce, Appl. Opt. 35, 2802 (1996)
18. D.R. Herriott, J.J. Schulte Jr., Appl. Opt. 4, 883 (1965)
19. P.C.D. Hobbs, Opt. Photon. News 2, 17 (1991)
20. K.L. Haller, P.C.D. Hobbs, Proc. SPIE 1435, 298 (1991)
21. G. Buelachvili, K.N. Rao, Handbook of Infrared Standards II (Academic, Orlando, 1993)
22. D.G. Lancaster, D. Richter, R.F. Curl, F.K. Tittel, Appl. Phys. B 67, 339 (1998)