Study and implementation of a soft X-ray 100 eV - 20 keV fixed exit monochromator system

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6266 II, Issue , 2006, Pages

  Pelliciari, C ^a   Barbera, M ^b   Candia, R ^a   Collura, A ^a   Di Cicca, G ^a   Pareschi, G ^c   Varisco, S ^a  

^a INAF OSSERVATORIO ASTROFISICO DI TORINO   (Italy)

^b UNIVERSITY OF PALERMO   (Italy)

^c INAF IASF MILANO   (Italy)

Author keywords

Crystals; Diffracting elements; Multilayer; Soft x ray; X ray monochromator

Indexed keywords

ASTRONOMY; ELECTROMAGNETIC WAVE DIFFRACTION; MULTILAYERS; OPTICAL TESTING; REMOTE CONTROL; X RAY ANALYSIS;

DIFFRACTING ELEMENTS; MICROPOSITIONING SYSTEM; SOFT X-RAY; X-RAY MONOCHROMATOR;

MONOCHROMATORS;

EID: 33749026086     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.673057     Document Type: Conference Paper

References (9)

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