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Volumn 83, Issue 1, 2004, Pages 63-76
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Reconstruction of thin conductivity imperfections
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Author keywords
Reconstruction; Thin dielectric inhomogeneities; Uniqueness
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Indexed keywords
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EID: 33749016558
PISSN: 15226514
EISSN: 15497879
Source Type: Journal
DOI: 10.1080/00036810310001620090 Document Type: Article |
Times cited : (27)
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References (6)
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