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Volumn 31, Issue 7, 2002, Pages 1055-1065

A characterization of generalized Pareto distributions by progressive censoring schemes and goodness-of-fit tests

Author keywords

Generalized Pareto distribution; Goodness of fit; Progressively Type II censored order statistics

Indexed keywords


EID: 33749011752     PISSN: 03610926     EISSN: None     Source Type: Journal    
DOI: 10.1081/STA-120004902     Document Type: Article
Times cited : (11)

References (14)
  • 5
    • 84952148724 scopus 로고
    • Linear Order Statistic Estimation for the Two-Parameter Weibull and Extreme Value Distributions from Type-II Progressively Censored Samples
    • Thomas, R.D.; Wilson, W.M. Linear Order Statistic Estimation for the Two-Parameter Weibull and Extreme Value Distributions from Type-II Progressively Censored Samples. Technometrics 1972, 14, 679-691.
    • (1972) Technometrics , vol.14 , pp. 679-691
    • Thomas, R.D.1    Wilson, W.M.2
  • 7
    • 70350334781 scopus 로고    scopus 로고
    • Sequential k-out-of-n Systems
    • Balakrishnan, N., Rao, C.R., Eds.; North-Holland, Amsterdam
    • Cramer, E.; Kamps, U. Sequential k-out-of-n Systems. In Handbook of Statistics Vol. 20: Advances in Reliability; Balakrishnan, N., Rao, C.R., Eds.; North-Holland, Amsterdam, 2001; pp. 301-372.
    • (2001) Handbook of Statistics Vol. 20: Advances in Reliability , vol.20 , pp. 301-372
    • Cramer, E.1    Kamps, U.2
  • 8
    • 0016510295 scopus 로고
    • Maximum-Likelihood Estimation for the Three-Parameter Weibull Distribution Based on Censored Samples
    • Lemon, G.H. Maximum-Likelihood Estimation for the Three-Parameter Weibull Distribution Based on Censored Samples. Technometrics 1975, 17, 247-254.
    • (1975) Technometrics , vol.17 , pp. 247-254
    • Lemon, G.H.1
  • 10
    • 0005287908 scopus 로고
    • An Approximation to the Wilcoxon-Mann-Whitney Distribution
    • Buckle, N.; Kraft, C.; van Eeden, C. An Approximation to the Wilcoxon-Mann-Whitney Distribution. J. Amer. Statist. Ass. 1969, 64, 591.
    • (1969) J. Amer. Statist. Ass. , vol.64 , pp. 591
    • Buckle, N.1    Kraft, C.2    Van Eeden, C.3
  • 14
    • 0017753852 scopus 로고
    • Goodness of Fit for the Extreme Value Distribution
    • Stephens, M.A. Goodness of Fit for the Extreme Value Distribution. Biometrika 1977, 64, 583-588.
    • (1977) Biometrika , vol.64 , pp. 583-588
    • Stephens, M.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.