JSV1.07 - A Java structure viewer

Journal of Applied Crystallography

Volumn 32, Issue 5, 1999, Pages 1027-1028

  Weber, S ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33749006906     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899009140     Document Type: Article

References (5)

1. Grahn, H. (1999). GLVIEW3.6, http://www.snafu.de/~hg/.
2. Izumi, F. (1999). FAT-RIETAN: Rietveld Refinement Software. Home page of Fujio Izumi, http://www.nirim.go.jp/~izumi.
3. Kraus, W. & Nolze, G. (1996). J. Appl. Cryst. 29, 301.
4. Materials Data Inc. (1999). MICRO POWD, http://www.materialsdata.com.
5. Sun Microsystems (1999). Sun Microsystems, http://www.sun.com.