The effects of instrumental elliptical polarization on stellar point spread function fine structure

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6265 II, Issue , 2006, Pages

  Carson, Joseph C ^a,b   Kern, Brian D ^b   Trauger, John T ^b   Breckinridge, James B ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Instrumentation: high angular resolution; Methods: analytical; Methods: laboratory; Polarization

Indexed keywords

ABERRATIONS; DIFFRACTION; IMAGING SYSTEMS; NUMERICAL ANALYSIS; OPTICAL TRANSFER FUNCTION; REFLECTION;

INSTRUMENTATION: HIGH ANGULAR RESOLUTION; METHODS: ANALYTICAL; METHODS: LABORATORY; TERRESTRIAL PLANET FINDER (TPF);

POLARIZATION;

EID: 33748999556     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.672518     Document Type: Conference Paper

References (4)

1. Balasubramanian, K., Hoppe, D. J., Mouroulis, P. Z., Marchen, L. F., & Shaklan, S. B. 2005, SPIE 5905, 59050H
2. Breckinridge, J. B. & Oppenheimer, B. R. 2004, ApJ 600, 1091
3. Kohazi-Kis, A. 2005, Optics Communications 253, 28
4. Trauger, J., Burrows, C., Gordon, B., Green, J., Lowman, A., Moody, D., Niessner, A., Shi, F., & Wilson, D. 2004, SPIE 5487, 1330