Effect of conductance variability on resistor-logic demultiplexers for nanoelectronics

IEEE Transactions on Nanotechnology

Volumn 5, Issue 5, 2006, Pages 446-453

  Kuekes, Philip J ^a,b   Robinett, Warren ^b   Williams, R Stanley ^b  

^a IEEE   (United States)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

Demultiplexing; Error correction coding; Nanotechnology; Resistive circuits; Voltage dividers

Indexed keywords

ERROR CORRECTION CODING; MICROELECTRONIC CIRCUITRY; RESISTIVE CIRCUITS;

COMPUTER SIMULATION; ELECTRIC CONDUCTANCE; ELECTRONIC EQUIPMENT; MULTIPLEXING EQUIPMENT; NANOTECHNOLOGY; VOLTAGE CONTROL; VOLTAGE DIVIDERS;

DEMULTIPLEXING;

EID: 33748996756     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2006.880405     Document Type: Article

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