Effect of freeze-thaw cycles on the properties and performance of membrane-electrode assemblies

Journal of Power Sources

Volumn 160, Issue 2 SPEC. ISS., 2006, Pages 1269-1274

  Guo, Qunhui ^a   Qi, Zhigang ^a  

^a Plug Power Inc   (United States)

Author keywords

Freeze thaw cycles; Freezing; Freezing damage; Membrane electrode assembly; PEM fuel cell

Indexed keywords

ATMOSPHERIC HUMIDITY; CRACKING (CHEMICAL); CYCLIC VOLTAMMETRY; FREEZING; HYDRATION; THAWING;

FREEZE-THAW CYCLES; FREEZING DAMAGE; MEMBRANE-ELECTRODE ASSEMBLY; PEM FUEL CELLS;

ELECTROCHEMICAL ELECTRODES;

EID: 33748985064     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2006.02.093     Document Type: Article

References (18)

1. Y. Ding, US Patent Number 6,632,555 (2003).
2. E.R. Eaton, W.H. Boon, C.J. Smith, US Patent Number 6,818,146 (2004).
3. T.F. Fuller, D.J. Wheeler, US Patent Number 6,068,941 (2000).
4. T.F. Fuller, D.J. Wheeler, US Patent Number 6,103,410 (2000).
5. J. Roberts, M. van der Geest, J. St-Pierre, D.P. Wilkinson, A. Lee, S. Moroz, US Patent Number 6,329,089 (2001).
6. J.A. Rock, L.B. Plant, US Patent Number 6,358,638 (2002).
7. R.D. Breault, US Patent Number 6,548,200 (2003).
8. C.A. Reiser, US Patent Number 6,777,115 (2004).
9. R.J. Assarabowski, W.T. Unkert, L.A. Bach, A.P. Grasso, B.C. Olsommer, US Patent Number 6,797,421 (2004).
10. H. Abe, Y. Asano, M. Kai, US Patent Number 6,815,103 (2004).
11. J. Roberts, M. van der Geest, J. St-Pierre, D.P. Wilkinson, A. Lee, S. Moroz, US Patent Number 6,764,780 (2004).
12. W.P. Acker, S. Gottesfeld, W.W. Dailey, US Patent Number 6,821,658 (2004).
13. C.A. Reiser, G. Resnick, US Patent Number 6,824,901 (2004).
14. R.L. Fuss, US Patent Number 6,358,637 (2002).
15. Cho E., Ko J.-J., Ha H.Y., Hong S.-A., Lee K.-Y., Lim T.-W., and Oh I.-H. J. Electrochem. Soc. 150 (2003) A1667
16. Cappadonia M., Erning J.W., and Stimming U. J. Electroanal. Chem. 376 (1994) 189
17. Saito M., Hayamizu K., and Okada T. J. Phys. Chem. B 109 (2005) 3112
18. Cho E., Ko J.-J., Ha H.Y., Hong S.-A., Lee K.-Y., Lim T.-W., and Oh I.-H. J. Electrochem. Soc. 151 (2004) A661