Optimization of phase objects in 4f coherent imaging system for nonlinear refraction measurements

Optics Communications

Volumn 266, Issue 2, 2006, Pages 686-690

  Li, Yunbo ^a   Zhang, Xueru ^a   Wang, Yuxiao ^a   Yang, Kun ^a   Song, Yinglin ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

4f imaging system; Phase objects; Third order nonlinear refractive index; Top hat beam

Indexed keywords

NONLINEAR OPTICS; OPTIMIZATION; REFRACTION; SENSITIVITY ANALYSIS;

4F IMAGING SYSTEM; PHASE OBJECTS; THIRD-ORDER NONLINEAR REFRACTIVE INDEX; TOP-HAT BEAM;

IMAGING SYSTEMS;

EID: 33748965915     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2006.05.050     Document Type: Article

References (9)

1. Boudebs G., Chis M., and Bourdin J.P. J. Opt. Soc. Am. B 13 (1996) 1450
2. Boudebs G., Chis M., and Monteil A. Opt. Commun. 150 (1998) 287
3. Cherukulappurath S., Boudebs G., and Monteil A. J. Opt. Soc. Am. B 21 (2004) 273
4. Zhao W., and Palffy-Muhoray P. Appl. Phys. Lett. 63 (1993) 1613
5. Sheik M., Said A.A., Wei T.H., Hagan D., and Stryland E.W. IEEE. J. Quantum Electron. 26 (1990) 760
6. Boudebs G., and Cherukulappurath S. Phys. Rev. A 69 (2004) 053813
7. Bruhat G. Optique (1992), Masson, Paris, France (Chapter XIV)
8. Shen Y.R. Nonlinear optics (1984), Wiley, New York (Chapter III)
9. Goodman J.W. Introduction to Fourier optics (1968), McGraw-Hill (Chapter II)