Modification of the surface state of rough substrates by two different varnishes and influence on the reflected light

Optics Communications

Volumn 266, Issue 2, 2006, Pages 586-591

  Elias, Mady ^a   Rene de la Rie E ^b   Delaney, John K ^b   Charron, Eric ^a   Morales, Kathryn M ^b  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

^b NATIONAL GALLERY OF ART   (United States)

Author keywords

Modelling; Profilometry; Reflectance spectroscopy; Reflected light; Roughness; Spatial frequency; Surface state; Varnish

Indexed keywords

BACKSCATTERING; INTERFACES (MATERIALS); MOLECULAR WEIGHT; NATURAL FREQUENCIES; PROFILOMETRY; VARNISH;

REFLECTANCE SPECTROSCOPY; REFLECTED LIGHT; SPATIAL FREQUENCY; SURFACE STATE;

SURFACE ROUGHNESS;

EID: 33748964623     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2006.05.051     Document Type: Article

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