Camber measurement based on Zernike moments at high accuracy

Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

Volumn 27, Issue 5, 2006, Pages 523-526

  Zheng, Yi ^a  

^a XIDIAN UNIVERSITY   (China)

Author keywords

Camber; Laser spot; Subpixel; Zernike moments

Indexed keywords

EID: 33748945855     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)