AFM based nanomanipulation system with 3D force feedback

Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

Volumn 27, Issue 7, 2006, Pages 661-665

  Tian, Xiaojun ^a,b   Wang, Yuechao ^a   Liu, Lianqing ^a,b   Jiao, Niandong ^a,b   Dong, Zaili ^a   Xi, Ning ^a  

^a SHENYANG INSTITUTE OF AUTOMATION   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Atomic force microscope (AFM); Nanomanipulation; Three dimensional (3D) nano forces

Indexed keywords

EID: 33748936321     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)