Structural analysis on planar defects formed in WC platelets in Ti-doped WC-Co

Journal of the American Ceramic Society

Volumn 89, Issue 10, 2006, Pages 3229-3234

  Lay, Sabine ^a   Loubradou, Marc ^a   Schubert, Wolf Dieter ^b  

^a GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRON MICROSCOPY; GRAIN GROWTH; SINTERING; STACKING FAULTS; STRUCTURAL ANALYSIS;

HIGH-RESOLUTION ELECTRON MICROSCOPY; LIQUID-PHASE SINTERING; WC-CO ALLOYS;

COBALT ALLOYS;

EID: 33748922248     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2006.01218.x     Document Type: Article

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