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Volumn 28, Issue 9, 2006, Pages 1028-1036

PHYBAL-A new method for lifetime prediction based on strain, temperature and electrical measurements

Author keywords

Lifetime prediction; Microstructural details; Plastic strain amplitude; Random and service loading; Temperature and resistance measurements

Indexed keywords

CRACKS; DURABILITY; ELECTRIC RESISTANCE; FATIGUE OF MATERIALS; HYSTERESIS; LOADS (FORCES); STRAIN; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33748905116     PISSN: 01421123     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijfatigue.2005.07.050     Document Type: Article
Times cited : (83)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.