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Volumn 162, Issue 1, 2006, Pages 87-99
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Markovian Testing and Trace Equivalences Exactly Lump More Than Markovian Bisimilarity
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Author keywords
bisimulation; Markov chain; Markovian process algebra
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Indexed keywords
COMPUTER SIMULATION;
MATHEMATICAL MODELS;
MARKOVIAN BISIMILARITY;
MARKOVIAN TESTING;
MARKOVIAN TRACE EQUIVALENCE;
MARKOV PROCESSES;
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EID: 33748895906
PISSN: 15710661
EISSN: None
Source Type: Journal
DOI: 10.1016/j.entcs.2005.12.079 Document Type: Article |
Times cited : (3)
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References (17)
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