TEM study of defects generated in 4H-SiC by microindentations on the prismatic plane

Philosophical Magazine Letters

Volumn 86, Issue 9, 2006, Pages 561-568

  Mussi, A ^a   Demenet, J L ^a   Rabier, J ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; MICROSTRUCTURE; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

DISSOCIATED DISLOCATIONS; DUCTILE TRANSITION TEMPERATURE; MICROINDENTATIONS; PRISMATIC SURFACE;

SINGLE CRYSTALS;

EID: 33748873987     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/09500830600930198     Document Type: Article

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