Zr k-edge EXAFS study of PZT thin film formation from sols

Physica Scripta T

Volumn T115, Issue , 2005, Pages 448-449

  Aron, I ^a,b   Mali, B ^b   Kosec, M ^b   Kodre, A ^b,c  

^a UNIVERSITY OF NOVA GORICA   (Slovenia)

^b JO EF STEFAN INSTITUTE   (Slovenia)

^c UNIVERSITY OF LJUBLJANA   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; LEAD COMPOUNDS; NANOPARTICLES; PHASE TRANSITIONS;

AMORPHOUS FILM DEPOSITION; LEAD ACETATE; OXIDE NANOPARTICLESS; ZIRCONIUM ATOMS;

THIN FILMS;

EID: 33748865812     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1238/Physica.Topical.115a00448     Document Type: Article

References (9)

1. Inoue N 2002 IEEE Trans. Electron Devices 49 1572
2. Muralt P 2000 J. Micromech. Microeng. 10 136
3. Tuttle B A and Schwarz R W 1996 Mater. Res. Soc. Bull. 21 49
4. Mali B et al 2000 Integrated Ferroelectrics 20 81
5. Huang Z, Zhang Q and Whatmore R W 1999 J. Appl. Phys. 85 7355
6. Wilkinson A P, Speck J S, Ceetham A K and Natarajan S 1994 Chem. Mater. 6 750
7. Stern E A, Newville M, Ravel B, Yacoby Y and Haskel D 1995 Physica B 208 117
8. Rehr J J, Albers R C and Zabinsky S I 1992 Phys. Rev. Lett. 69 3397
9. Teufer G 1962 Acta Crystallographica 15 1187