On lower tolerance limits with accurate coverage probabilities for the normal random effects model

Journal of the American Statistical Association

Volumn 101, Issue 475, 2006, Pages 1039-1049

  Chen, Shun Yi ^a   Harris, Bernard ^b  

^a TAMKANG UNIVERSITY   (Taiwan)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

Confidence levels; Noncentral t distribution; Variance ratio

Indexed keywords

EID: 33748865505     PISSN: 01621459     EISSN: None     Source Type: Journal    
DOI: 10.1198/016214506000000401     Document Type: Review

References (12)

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