-
1
-
-
33947477650
-
-
T. Seiyama, A. Kato, K. Fujiishi and M. Nagatani, Anal. Chem., 1962, 34, 1502.
-
(1962)
Anal. Chem.
, vol.34
, pp. 1502
-
-
Seiyama, T.1
Kato, A.2
Fujiishi, K.3
Nagatani, M.4
-
3
-
-
0020828532
-
-
N. Yamazoe, Y. Kurokawa and T. Seiyama, Sens. Act., 1983, 4, 283.
-
(1983)
Sens. Act.
, vol.4
, pp. 283
-
-
Yamazoe, N.1
Kurokawa, Y.2
Seiyama, T.3
-
4
-
-
33748821835
-
-
K. D. Schierbaum, J. Geiger, U. Weimar and W. Göpel, Sens. Act., 1983, 13-14, 143.
-
(1983)
Sens. Act.
, vol.13-14
, pp. 143
-
-
Schierbaum, K.D.1
Geiger, J.2
Weimar, U.3
Göpel, W.4
-
5
-
-
0042756887
-
-
V. Ambrazevičienê, A. Galdikas, S. Grebinskij, A. Mironas and H. Tvardauskas, Sens. Act. B, 1993, 17, 27.
-
(1993)
Sens. Act. B
, vol.17
, pp. 27
-
-
Ambrazevičienê, V.1
Galdikas, A.2
Grebinskij, S.3
Mironas, A.4
Tvardauskas, H.5
-
6
-
-
0010909857
-
-
J. F. McAleer, P. T. Moseley, J. O. W. Morris, D. E. Williams and B. C. Tofield, J. Chem. Soc., Faraday Trans. 1, 1988, 84, 441.
-
(1988)
J. Chem. Soc., Faraday Trans. 1
, vol.84
, pp. 441
-
-
McAleer, J.F.1
Moseley, P.T.2
Morris, J.O.W.3
Williams, D.E.4
Tofield, B.C.5
-
7
-
-
0019716434
-
-
G. N. Advani, Y. Komem, J. Hasenkopf and A. G. Jordan, Sens. Act., 1981, 2, 139.
-
(1981)
Sens. Act.
, vol.2
, pp. 139
-
-
Advani, G.N.1
Komem, Y.2
Hasenkopf, J.3
Jordan, A.G.4
-
8
-
-
0026151713
-
-
K. D. Schierbaum, U. K. Kirner, J. F. Geiger and W. Göpel, Sens. Act. B, 1991, 4, 87.
-
(1991)
Sens. Act. B
, vol.4
, pp. 87
-
-
Schierbaum, K.D.1
Kirner, U.K.2
Geiger, J.F.3
Göpel, W.4
-
10
-
-
25344472423
-
-
K. Nomura, S. S. Sharma and Y. Ujihira, Nucl. Inst. Meth. Phys. Res. B, 1993, 76, 357.
-
(1993)
Nucl. Inst. Meth. Phys. Res. B
, vol.76
, pp. 357
-
-
Nomura, K.1
Sharma, S.S.2
Ujihira, Y.3
-
11
-
-
0000171174
-
-
M. Labeau, B. Gautheron, F. Cellier, M. Vallet-Regi, E. Garcia and J. M. Gonzalez Calbet, J. Solid State Chem., 1993, 102, 434.
-
(1993)
J. Solid State Chem.
, vol.102
, pp. 434
-
-
Labeau, M.1
Gautheron, B.2
Cellier, F.3
Vallet-Regi, M.4
Garcia, E.5
Gonzalez Calbet, J.M.6
-
12
-
-
0024091105
-
-
S. Matsushima, Y. Teraoka, N. Muira and N. Yamazoe, Jpn. J. Appl. Phys., 1988, 27, 1798.
-
(1988)
Jpn. J. Appl. Phys.
, vol.27
, pp. 1798
-
-
Matsushima, S.1
Teraoka, Y.2
Muira, N.3
Yamazoe, N.4
-
13
-
-
0027562453
-
-
K. D. Schierbaum, X. Wei-Xing and W. Göpel, Ber. Bunsen-Ges. Phys. Chem., 1993, 97, 363.
-
(1993)
Ber. Bunsen-Ges. Phys. Chem.
, vol.97
, pp. 363
-
-
Schierbaum, K.D.1
Wei-Xing, X.2
Göpel, W.3
-
14
-
-
0022816708
-
-
I. Lundstom, M. Armgarth, A. Spetz and F. Winquist, Sens. Act., 1986, 10, 399.
-
(1986)
Sens. Act.
, vol.10
, pp. 399
-
-
Lundstom, I.1
Armgarth, M.2
Spetz, A.3
Winquist, F.4
-
15
-
-
0028430223
-
-
P. Marecot, A. Fakche, B. Kellil, G. Mabilon, M. Prigent and J. Barbier, Appl. Catal. B, 1994, 3, 283.
-
(1994)
Appl. Catal. B
, vol.3
, pp. 283
-
-
Marecot, P.1
Fakche, A.2
Kellil, B.3
Mabilon, G.4
Prigent, M.5
Barbier, J.6
-
16
-
-
0003828439
-
-
ed. D. Briggs and M. P. Seah, Wiley, Chichester
-
C. D. Wagner, in Practical Surface Analysis, ed. D. Briggs and M. P. Seah, Wiley, Chichester, 1990, vol. 1.
-
(1990)
Practical Surface Analysis
, vol.1
-
-
Wagner, C.D.1
-
17
-
-
0022059575
-
-
D. F. Cox, G. B. Hoflund and H. A. Laitinen, Langmuir, 1985, 1, 269.
-
(1985)
Langmuir
, vol.1
, pp. 269
-
-
Cox, D.F.1
Hoflund, G.B.2
Laitinen, H.A.3
-
18
-
-
0022088506
-
-
G. B. Hoflund, D. A. Asbury and R. E. Gilbert, Thin Solid Films, 1985, 129, 139.
-
(1985)
Thin Solid Films
, vol.129
, pp. 139
-
-
Hoflund, G.B.1
Asbury, D.A.2
Gilbert, R.E.3
-
20
-
-
0000301787
-
-
S. D. Gardner, G. B. Hoflund, D. R. Schryer and B. T. Upchurch, J. Phys. Chem., 1991, 95, 835.
-
(1991)
J. Phys. Chem.
, vol.95
, pp. 835
-
-
Gardner, S.D.1
Hoflund, G.B.2
Schryer, D.R.3
Upchurch, B.T.4
-
22
-
-
0003488560
-
-
E. I. Altman and R. J. Gorte, Surf. Sci., 1989, 216, 386, 1989.
-
(1989)
Surf. Sci.
, vol.216
, Issue.386
, pp. 1989
-
-
Altman, E.I.1
Gorte, R.J.2
-
30
-
-
2342532542
-
-
E. W. Williams, C. M. Lawlor, A. G. Keeling and R. D. Gould, Int. J. Electron., 1994, 76, 815.
-
(1994)
Int. J. Electron.
, vol.76
, pp. 815
-
-
Williams, E.W.1
Lawlor, C.M.2
Keeling, A.G.3
Gould, R.D.4
|