Thin manganite films for fast fault current limiter applications

Thin Solid Films

Volumn 515, Issue 2 SPEC. ISS., 2006, Pages 576-579

  Zurauskiene N ^a  

^a CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

Author keywords

Electromagnetic pulse (EMP); Limiters; Manganite thin films

Indexed keywords

ATTENUATION; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; ELECTRICAL ENGINEERING; ELECTROMAGNETIC PULSE; LIMITERS; MANGANESE COMPOUNDS; PEROVSKITE; POLYCRYSTALLINE MATERIALS; THERMAL EFFECTS;

MANGANITE THIN FILMS; POLYCRYSTALLINE FILMS; THRESHOLD ELECTRIC FIELD;

THIN FILMS;

EID: 33748805479     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.12.172     Document Type: Article

References (7)

1. Balevičius S. Jane's Infrastructure Security Conference (2002) 1
2. Brown M., Merritt I., Altgilbers L., Ray L., Zhang T.X., and Tracy P. AIAA 99-3811 (1999)
3. Balevičius S., Pyragas V., Žurauskienė N., and Altgilbers L.L. IEEE Trans. Appl. Supercond. 14 (2004) 112
4. Balevičius S., Kiprijanovič O., Anisimovas F., Vengalis B., Žurauskienė N., and Altgilbers L.L. J. Phys. IV France 11 (2001) 91
5. Abrutis A., Plaušinaitienė V., Kubilius V., Teišerskis A., Šaltytė Z., Butkute R., and Senateur J.P. Thin Solid Films 413 (2002) 32
6. Cimmperman P., Stankevič V., Žurauskienė N., Balevičius S., Anisimovas F., Paršeliūnas J., Kiprijanovič O., and Altgilbers L.L. Acta Phys. Pol. A 105 (2004) 107
7. Gross R., Alff L., Buchner B., Freitag B.H., Hofener C., Klein J., Lu Y., Mader W., Philipp J.B., Rao M.S.R., Reutler P., Ritter S., Thienhaus S., Uhlenbruck S., and Weidenhorst B. J. Magn. Magn. Mater. 211 (2000) 150