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Volumn 85, Issue 3, 2006, Pages 657-660

Studies on the thermal stability of nano-SiC powder with excessive free carbon by TG-DTA-MS, XRD and TEM

Author keywords

Nano SiC powder; TEM; TG DTA MS; Thermal stability; XRD

Indexed keywords

DIFFERENTIAL THERMAL ANALYSIS; REMOVAL; SILICON CARBIDE; THERMODYNAMIC STABILITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 33748803654     PISSN: 13886150     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10973-006-7647-6     Document Type: Conference Paper
Times cited : (11)

References (10)
  • 5
    • 28944435353 scopus 로고    scopus 로고
    • Shanghai Science and Technology Reference Publishing House, Jan. Shanghai
    • L. Chang-Wei and X. Tong-Geng, 'Thermal Analysis Mass Spectrometry', Shanghai Science and Technology Reference Publishing House, Jan. 2002, Shanghai.
    • (2002) Thermal Analysis Mass Spectrometry
    • Chang-Wei, L.1    Tong-Geng, X.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.