Determination of trace impurities in high-purity zirconium dioxide by inductively coupled plasma atomic emission spectrometry using microwave-assisted digestion and wavelet transform-based correction procedure

Analytica Chimica Acta

Volumn 579, Issue 1, 2006, Pages 47-52

  Ma, Xiaoguo ^a   Li, Yibing ^a  

^a GUANGDONG UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Inductively coupled plasma atomic emission spectrometry; Microwave assisted digestion; Spectral interference correction; Trace element analysis; Wavelet transform; Zirconium dioxide

Indexed keywords

CONCENTRATION (PROCESS); INDUCTIVELY COUPLED PLASMA; MIXTURES; TRACE ELEMENTS; WAVELET TRANSFORMS; ZIRCONIUM COMPOUNDS;

INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY; MICROWAVE-ASSISTED DIGESTION; SPECTRAL INTERFERENCE CORRECTION; TRACE ELEMENT ANALYSIS; ZIRCONIUM DIOXIDE;

TRACE ANALYSIS;

AMMONIUM SULFATE; HAFNIUM; IRON; MANGANESE; REAGENT; SILICON; SODIUM; SULFURIC ACID; TITANIUM; TRACE ELEMENT; ZIRCONIUM OXIDE;

ACCURACY; ARTICLE; ATOMIC EMISSION SPECTROMETRY; DISSOLUTION; EXPERIMENTATION; MATHEMATICAL ANALYSIS; MICROWAVE IRRADIATION; POWDER; PRIORITY JOURNAL; SPECTROSCOPY;

EID: 33748784594     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.aca.2006.07.019     Document Type: Article

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